Ellipsometric studies of nanocrystalline silicon films with the thicknesses less than 100 nm
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Ukrainian Journal of Physical Optics
سال: 2016
ISSN: 1609-1833
DOI: 10.3116/16091833/17/3/124/2016